ZEISS introduces Crossbeam 750 FIB-SEM for sample prep
ZEISS has launched the Crossbeam 750, a focused ion beam scanning electron microscope (FIB-SEM) system featuring new Gemini 4 optics that enable real-time milling feedback during sample preparation. The system is designed to support transmission electron microscopy (TEM) lamella preparation, 3D structural analysis, and tomography workflows. The instrument targets advanced materials characterization and failure analysis applications in research and industrial settings.